中文简介

结构动力学关注于实验和理论方法和技术的最新发展，这些方法和技术允许实时可视化化学、生物和凝聚态物质系统的电子和几何结构变化。从事结构动力学研究的科学家和工程师经常使用类似的仪器和方法。该杂志欢迎关于电子和结构动力学基本问题的文章，这些问题是用新方法处理的，例如:时间分辨x射线和电子衍射及散射相干衍射成像时间分辨x射线光谱(吸收、发射、共振非弹性散射等)时间分辨电子能谱(EELS)和电子显微镜时间分辨光电子光谱(UPS、XPS、ARPES等)红外、可见光和紫外的多维光谱非线性光谱在VUV，软x射线和硬x射线领域分析和描述结构动力学及其相关实验信号的理论、计算方法和算法这些新方法是通过新的仪器来实现的，例如:x射线自由电子激光器，提供通量、相干性和时间分辨率超短电子脉冲的新来源超短真空紫外(VUV)到硬x射线脉冲的新源，如高谐波产生(HHG)源或等离子体基源超短红外和太赫兹(THz)辐射的新来源新的x射线和电子探测器新的样品处理和交付方案新的计算能力

投稿网址：http://sd.peerx-press.org/cgi-bin/main.plex

英文简介

Structural Dynamics focuses on the recent developments in experimental and theoretical methods and techniques that allow a visualization of the electronic and geometric structural changes in real time of chemical, biological, and condensed-matter systems. The community of scientists and engineers working on structural dynamics in such diverse systems often use similar instrumentation and methods.The journal welcomes articles dealing with fundamental problems of electronic and structural dynamics that are tackled by new methods, such as:Time-resolved X-ray and electron diffraction and scatteringCoherent diffractive imagingTime-resolved X-ray spectroscopies (absorption, emission, resonant inelastic scattering, etc.)Time-resolved electron energy loss spectroscopy (EELS) and electron microscopyTime-resolved photoelectron spectroscopies (UPS, XPS, ARPES, etc.)Multidimensional spectroscopies in the infrared, the visible and the ultravioletNonlinear spectroscopies in the VUV, the soft and the hard X-ray domainsTheory and computational methods and algorithms for the analysis and description of structural dynamics and their associated experimental signalsThese new methods are enabled by new instrumentation, such as:X-ray free electron lasers, which provide flux, coherence, and time resolutionNew sources of ultrashort electron pulsesNew sources of ultrashort vacuum ultraviolet (VUV) to hard X-ray pulses, such as high-harmonic generation (HHG) sources or plasma-based sourcesNew sources of ultrashort infrared and terahertz (THz) radiationNew detectors for X-rays and electronsNew sample handling and delivery schemesNew computational capabilities